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Conference Paper

Precision Optical Frequency Metrology Using Pulsed Lasers

MPS-Authors
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Udem,  Thomas
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

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Holzwarth,  Ronald
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

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Zimmermann,  Marcus
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

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Hänsch,  T. W.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

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Udem, T., Holzwarth, R., Zimmermann, M., & Hänsch, T. W. (2002). Precision Optical Frequency Metrology Using Pulsed Lasers. In Y. A. Ono, & K. Fujikawa (Eds.), Foundations of Quantum Mechanics in the Light of New Technology: Proceedings of the 7th International Symposium (pp. 253-258). Singapore: World Scientific.


Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-C2C2-6
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