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Conference Paper

Frequency Comparison of I2 Stabilized Lasers at 532 nm and Absolute Frequency Measurement of I2 Absorption Lines

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons60723

Nevsky,  Alexander Y.
Laser Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons60574

Holzwarth,  Ronald
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons60970

Zimmermann,  Marcus
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons60893

Udem,  Thomas
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons60535

Hänsch,  T. W.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons60912

von Zanthier,  Joachim
Laser Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons60915

Walther,  Herbert
Laser Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons60763

Pokasov,  Pavel V.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

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Citation

Nevsky, A. Y., Holzwarth, R., Zimmermann, M., Udem, T., Hänsch, T. W., von Zanthier, J., et al. (2002). Frequency Comparison of I2 Stabilized Lasers at 532 nm and Absolute Frequency Measurement of I2 Absorption Lines. In P. Gill (Ed.), Proceedings of the 6th Symposium on Frequency Standards and Metrology (pp. 521-523). New Jersey: World Scientific.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-C28D-F
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