Novel method for characterizing relativistic electron beams in a harsh 
laser-plasma environment

Hidding, B.; Pretzler, G.; Clever, M.; Brandl, F.; Zamponi, F.; Lübcke, A.; Kämpfer, T.; Uschmann, I.; Förster, E.; Schramm, U.; Sauerbrey, R.; Kroupp, E.; Veisz, Laszlo; Schmid, Karl; Benavides, Sofia; Karsch, Stefan

doi:10.1063/1.2775668

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

学術論文

Novel method for characterizing relativistic electron beams in a harsh laser-plasma environment

MPS-Authors

/persons/resource/persons60770

Pretzler, G.
Laser Plasma Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60425

Brandl, F.
Laser Plasma Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60827

Schramm, U.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60902

Veisz, Laszlo
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60821

Schmid, Karl
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60413

Benavides, Sofia
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60597

Karsch, Stefan
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Hidding, B., Pretzler, G., Clever, M., Brandl, F., Zamponi, F., Lübcke, A., Kämpfer, T., Uschmann, I., Förster, E., Schramm, U., Sauerbrey, R., Kroupp, E., Veisz, L., Schmid, K., Benavides, S., & Karsch, S. (2007). Novel method for characterizing relativistic electron beams in a harsh laser-plasma environment. Review of Scientific Instruments, 78(8):. doi:10.1063/1.2775668.

引用: https://hdl.handle.net/11858/00-001M-0000-000F-B759-B

要旨

要旨はありません