Characterization of large area avalanche photodiodes in X-ray and VUV-light 
detection

Fernandes, L. M. P.; Amaro, F. D.; Antognini, A.; Cardoso, J. M. R.; Conde, C. A. N.; Huot, O.; Knowles, P. E.; Kottmann, F.; Lopes, J. A. M.; Ludhova, L.; Monteiro, C. M. B.; Mulhauser, F.; Pohl, R.; dos Santos, J. M. F.; Schaller, L. A.; Taqqu, D.; Veloso, J. F. C. A.

doi:10.1088/1748-0221/2/08/P08005

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Characterization of large area avalanche photodiodes in X-ray and VUV-light detection

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Antognini, A.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

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Pohl, R.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

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Fernandes, L. M. P., Amaro, F. D., Antognini, A., Cardoso, J. M. R., Conde, C. A. N., Huot, O., et al. (2007). Characterization of large area avalanche photodiodes in X-ray and VUV-light detection. Journal of Instrumentation, 2: P08005. doi:10.1088/1748-0221/2/08/P08005.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-B744-A

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