State-of-the-art attosecond metrology

Schultze, Martin; Wirth, Adrian; Grguras, Ivanka; Uiberacker, Matthias; Uphues, Thorsten; Verhoef, Aart J.; Gagnon, Justin; Hofstetter, M.; Kleineberg, U.; Goulielmakis, Eleftherios; Krausz, Ferenc

doi:10.1016/j.elspec.2011.01.003

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State-of-the-art attosecond metrology

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Schultze, Martin
Attosecond Dynamics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Wirth, Adrian
Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;
Attoelectronics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons61044

Grguras, Ivanka
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60895

Uiberacker, Matthias
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60897

Uphues, Thorsten
Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60903

Verhoef, Aart J.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60501

Gagnon, Justin
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60616

Kleineberg, U.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60517

Goulielmakis, Eleftherios
Attoelectronics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60638

Krausz, Ferenc
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Schultze, M., Wirth, A., Grguras, I., Uiberacker, M., Uphues, T., Verhoef, A. J., et al. (2011). State-of-the-art attosecond metrology. Journal of Electron Spectroscopy and Related Phenomena, 184(3-6 Sp. Iss. Sp. Iss. SI), 68-77. doi:10.1016/j.elspec.2011.01.003.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-AE04-0

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