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Surface Film Formation by Chemical Vapor Deposition of Di-p-xylylene: Ellipsometrical, Atomic Force Micrsocopy, and X-Ray Studies

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Walter,  H.
MPI for Polymer Research, Max Planck Society;

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Göschel, U., & Walter, H. (2000). Surface Film Formation by Chemical Vapor Deposition of Di-p-xylylene: Ellipsometrical, Atomic Force Micrsocopy, and X-Ray Studies. Langmuir, 16, 2887-2892.


Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-6ACD-A
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