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Film-thickness dependence of structure formation in ultra-thin polymer blend films

MPG-Autoren
http://pubman.mpdl.mpg.de/cone/persons/resource/persons47980

Gutmann,  Jochen S.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons48792

Stamm,  Manfred
MPI for Polymer Research, Max Planck Society;

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Zitation

Gutmann, J. S., Müller-Buschbaum, P., & Stamm, M. (2002). Film-thickness dependence of structure formation in ultra-thin polymer blend films. Applied Physics A-Materials Science & Processing, 74(Suppl. S), S463-S465.


Zitierlink: http://hdl.handle.net/11858/00-001M-0000-000F-647F-E
Zusammenfassung
We investigated the film-thickness dependence of structure formation in ultra-thin polymer blend films prepared from solution. As a model system we used binary blends of statistical poly(styrene-co-p-bromostyrene) copolymers of different degrees of bromination. Ultra-thin-film samples differing in miscibility and film thickness were prepared via spin coating of common toluene solutions onto silicon (100) substrates. The resulting morphologies were investigated with scanning force microscopy, reflectometry and grazing-incidence scattering techniques using both X-rays and neutrons in order to obtain a picture of the sample structure at and below the sample surface.