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Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces

MPG-Autoren
http://pubman.mpdl.mpg.de/cone/persons/resource/persons48344

Lorenz-Haas,  C.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons49023

Wunnicke,  O.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons47694

Cassignol,  C.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons48792

Stamm,  Manfred
MPI for Polymer Research, Max Planck Society;

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Zitation

Lorenz-Haas, C., Müller-Buschbaum, P., Wunnicke, O., Cassignol, C., Burghammer, M., Riekel, C., et al. (2003). Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces. Langmuir, 19(7), 3056-3061.


Zitierlink: http://hdl.handle.net/11858/00-001M-0000-000F-6234-2
Zusammenfassung
The technique of scanning small-angle X-ray scattering with a microsized beam (SM-SAXS) has been used to study crack propagation in poly(methyl methacrylate) (PMMA). Two pieces of PMMA are welded together, and the creation of defect structures is followed in the energy dissipation zone at the end of a crack tip at the PMMA-PMMA interface by SM-SAXS. The defect region is scanned in two dimensions perpendicular to the crack propagation with a 10 μm beam. At each position the SAXS pattern is obtained on an area detector which provides information on defect contrast, distribution, and orientation around the crack. From this investigation detailed structural information at micrometer spatial resolution is available, providing a microscopic image of the crack zone.