The inverse electromechanical effect in mechanically oriented S-C*-elastomers 
examined by means of an ultra-stable Michelson interferometer

Lehmann, W.; Gattinger, P.; Keck, M.; Kremer, F.; Stein, P.; Eckert, T.; Finkelmann, H.

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The inverse electromechanical effect in mechanically oriented S-C*-elastomers examined by means of an ultra-stable Michelson interferometer

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Kremer, F.
MPI for Polymer Research, Max Planck Society;

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Lehmann, W., Gattinger, P., Keck, M., Kremer, F., Stein, P., Eckert, T., et al. (1998). The inverse electromechanical effect in mechanically oriented S-C*-elastomers examined by means of an ultra-stable Michelson interferometer. Ferroelectrics, 208(1-4), 373-383.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-5741-E

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