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Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons47693

Casagrande,  M.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons47980

Gutmann,  Jochen S.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons48237

Kuhlmann,  T.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons48792

Stamm,  Manfred
MPI for Polymer Research, Max Planck Society;

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Citation

Müller-Buschbaum, P., Casagrande, M., Gutmann, J. S., Kuhlmann, T., Stamm, M., von Krosigk, G., et al. (1998). Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up. Europhysics Letters, 42, 517-522.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-5603-F
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