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Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons48983

Weisser,  M.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons48416

Menges,  B.
MPI for Polymer Research, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons48442

Mittler-Neher,  Silvia
MPI for Polymer Research, Max Planck Society;

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Citation

Weisser, M., Menges, B., & Mittler-Neher, S. (1999). Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons. Sensors and Actuators B-Chemical, 56, 189-197.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-53BD-9
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