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Conference Paper

3D Model Acquisition Including Reflection Properties

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons44911

Lensch,  Hendrik P. A.
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons44747

Kautz,  Jan
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons44506

Goesele,  Michael
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons45449

Seidel,  Hans-Peter
Computer Graphics, MPI for Informatics, Max Planck Society;

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Citation

Lensch, H. P. A., Kautz, J., Goesele, M., & Seidel, H.-P. (2001). 3D Model Acquisition Including Reflection Properties. In D. W. Fellner, N. Fuhr, & I. Witten (Eds.), Proceedings of the ECDL Workshop Generalized Documents (pp. 1-6). Darmstadt: Selbstverlag.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-3259-D
Abstract
The measurement of accurate material properties is an important step towards the inclusion of realistic objects in digital documents. Many real-world objects are composed of a number of materials with subtle changes even within a single material. We present an image-based measuring method that robustly detects the different materials of real objects and fits an average bidirectional reflectance distribution function (BRDF) to each of them. In order to model the local changes as well, we project the measured data for each surface point into a basis formed by the recovered BRDFs leading to a truly spatially varying BRDF representation. A compact, high quality model of a real object can be generated with relatively few input data.