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Adaptive sampling of reflectance fields

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons44457

Fuchs,  Martin
Computer Graphics, MPI for Informatics, Max Planck Society;
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons44144

Blanz,  Volker
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons44911

Lensch,  Hendrik P. A.
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons45449

Seidel,  Hans-Peter
Computer Graphics, MPI for Informatics, Max Planck Society;

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Citation

Fuchs, M., Blanz, V., Lensch, H. P. A., & Seidel, H.-P. (2007). Adaptive sampling of reflectance fields. ACM Transactions on Graphics, 26(2), 10.1-18. doi:10.1145/1243980.1243984.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-1DDC-C
Abstract
Image-based relighting achieves high quality in rendering, but it requires a large number of measurements of the reflectance field. This article discusses sampling techniques that improve on the trade-offs between measurement effort and reconstruction quality. Specifically, we (i) demonstrate that sampling with point lights and from a sparse set of incoming light directions creates artifacts which can be reduced significantly by employing extended light sources for sampling, (ii) propose a sampling algorithm which incrementally chooses light directions adapted to the properties of the reflectance field being measured, thus capturing significant features faster than fixed-pattern sampling, and (iii) combine reflectance fields from two different light domain resolutions. We present an automated measurement setup for well-defined angular distributions of the incident, indirect illumination. It is based on programmable spotlights with controlled aperture that illuminate the walls around the scene.