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Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons30816

Mokler,  P. H.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Ray, C., Braeuning-Demian, A., Braeuning, H., Chevallier, M., Cohen, C., Dauvergne, D., et al. (2011). Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals. Physical review B, 84(2): 024119. doi:10.1103/PhysRevB.84.024119.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-1339-8
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