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On the accuracy of lattice-distortion analysis directly from high-resolution transmission electron micrographs

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Du,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Du, K., & Phillipp, F. (2006). On the accuracy of lattice-distortion analysis directly from high-resolution transmission electron micrographs. Journal of Microscopy, 221, 63-71.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-488A-D
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