Quantitative analysis of multi-element oxide thin films by angle-resolved XPS: 
application to ultra-thin oxide films on MgAl substrates

Jeurgens, L. P. H.; Vinodh, M. S.; Mittemeijer, E. J.

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Quantitative analysis of multi-element oxide thin films by angle-resolved XPS: application to ultra-thin oxide films on MgAl substrates

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Jeurgens, L. P. H.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Vinodh, M. S.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Mittemeijer, E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Jeurgens, L. P. H., Vinodh, M. S., & Mittemeijer, E. J. (2006). Quantitative analysis of multi-element oxide thin films by angle-resolved XPS: application to ultra-thin oxide films on MgAl substrates. Applied Surface Science, 253, 627-638.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-484D-A

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