The influence of optical light on the charge transfer efficiency of the XMM 
EPIC pn-CCD camera

Pal, J.; Kuster, M.; Kendziorra, E.; Krause, N.

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The influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera

Pal, J., Kuster, M., Kendziorra, E., & Krause, N. (1999). The influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera. In O. Siegmund, & K. Flanagan (Eds.), EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X (pp. 683-692). Bellingham, Wash., USA: Society of Photo-Optical Instrumentation Engineers.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-ECB0-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-ECB1-6

Genre: Conference Paper

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Creators:
Pal, J., Author
Kuster, M., Author
Kendziorra, E., Author
Krause, N.¹, Author

Affiliations:
1Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society, ou_159889

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Language(s): eng - English

Dates: Date issued: 1999

Publication Status: Issued

Pages: -

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Rev. Type: -

Identifiers: eDoc: 294764
Other: AS 24/56, p.683-692

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Title: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X

Place of Event: Denver, Colorado, USA

Start-/End Date: 1999-07-21 - 1999-07-23

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Title: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X

Source Genre: Proceedings

Creator(s):
Siegmund, O.H.W., Editor
Flanagan, K.A., Editor

Affiliations:
-

Publ. Info: Bellingham, Wash., USA : Society of Photo-Optical Instrumentation Engineers

Pages: 838 p. Volume / Issue: - Sequence Number: - Start / End Page: 683 - 692 Identifier: ISBN: 0-8194-3251-2

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Title: Proceedings of SPIE

Source Genre: Series

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Pages: - Volume / Issue: 3765 Sequence Number: - Start / End Page: - Identifier: -