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  Development of calibration methods for a photon emission microscope to analyse light emitted from semiconductor detectors

Feuerbaum, C. (2008). Development of calibration methods for a photon emission microscope to analyse light emitted from semiconductor detectors. Diploma Thesis, Technische Universität München, München, Germany.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-C817-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-C818-2
Genre: Thesis

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 Creators:
Feuerbaum, Christian1, Author
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1Max Planck Society, ou_persistent13              

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Language(s): eng - English
 Dates: 2008-01
 Publication Status: Accepted / In Press
 Pages: 78 p.
 Publishing info: München, Germany : Technische Universität München
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 423580
Other: AL 04/1044
 Degree: Diploma

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