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  Noise reduction in CCD measurements by improving the quality of dark-reference images

Heil, T., & Tatlock, G. J. (2018). Noise reduction in CCD measurements by improving the quality of dark-reference images. Microscopy, 67(suppl_1), i123-i132. doi:10.1093/jmicro/dfy006.

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Heil, Tobias1, Author           
Tatlock, Gordon J., Author
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1Nadezda V. Tarakina, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_2522693              

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Free keywords: transmission electron microscopy, CCD camera, noise reduction, cosmic rays, x-ray noise, dark reference
 Abstract: This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct X-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of X-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.

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Language(s): eng - English
 Dates: 2018-02-132018
 Publication Status: Issued
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 Identifiers: DOI: 10.1093/jmicro/dfy006
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Title: Microscopy
Source Genre: Journal
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Publ. Info: Oxford, England, UK : Oxford University Press
Pages: - Volume / Issue: 67 (suppl_1) Sequence Number: - Start / End Page: i123 - i132 Identifier: ISSN: 2050-5698