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  Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging

Butler, T., Slepneva, S., McNamara, P. M., Neuhaus, K., Goulding, D., Leahy, M., et al. (2017). Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging. IEEE Photonics Journal, 9(5): 1505810. doi:10.1109/JPHOT.2017.2752644.

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 Creators:
Butler, Thomas1, Author           
Slepneva, S.2, Author
McNamara, P. M.2, Author
Neuhaus, K.2, Author
Goulding, D.2, Author
Leahy, M.2, Author
Huyet, G.2, Author
Affiliations:
1Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              
2external, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-102017-10
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1109/JPHOT.2017.2752644
URI: ieeexplore.ieee.org/document/8038247
Other: 5439
 Degree: -

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Title: IEEE Photonics Journal
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: IEEE
Pages: - Volume / Issue: 9 (5) Sequence Number: 1505810 Start / End Page: - Identifier: -