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  Characterization and optimization of a thin direct electron detector for fast imaging applications

Dourki, I., Westermeier, F., Schopper, F., Richter, R., Andricek, L., Ninkovic, J., et al. (2017). Characterization and optimization of a thin direct electron detector for fast imaging applications. In Journal of Instrumentation. doi:10.1088/1748-0221/12/03/C03047.

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Dourki_2017_J._Inst._12_C03047.pdf (Publisher version), 3MB
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Dourki_2017_J._Inst._12_C03047.pdf
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© IOP Publishing Ltd and Sissa Medialab
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https://doi.org/10.1088/1748-0221/12/03/C03047 (Publisher version)
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 Creators:
Dourki, Ibrahym1, 2, Author           
Westermeier, F.2, Author
Schopper, F.3, Author
Richter, R.H.3, Author
Andricek, L.3, Author
Ninkovic, J.3, Author
Treis, J.3, Author
Koffmane, C.3, Author
Wassatsch, A.3, Author
Peric, I.4, Author
Epp, S.W.2, Author
Miller, R.J.D.2, 5, Author
Affiliations:
1International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_2266714              
2Max Planck Institute for the Structure and Dynamics of Matter, Center for Free Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany, ou_persistent22              
3Halbleiterlabor der Max-Planck-Gesellschaft, Otto-Hahn-Ring 6, 81739 München, Germany, ou_persistent22              
4Karlsruhe Institute of Technology (KIT), Institute for Data Processing and Electronics (IPE), 76021 Karlsruhe, Germany, ou_persistent22              
5Departments of Chemistry and Physics, University of Toronto, 80 St. George Street, Toronto M5S 1H6, Canada, ou_persistent22              

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Free keywords: Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc); Solid state detectors
 Abstract: Direct electron detectors are increasingly used to explore the dynamics of macromolecules in real space and real time using transmission electron microscopy. The purpose of this work is to optimize the most suitable detector configuration of a thin silicon detector by Monte Carlo Simulations. Several simulations were performed to achieve an advanced detector geometry that reduces significantly the background signal due to backscattered electrons resulting in an enhanced imaging performance of the detector. Utilizing DEPFET (DEpleted P-channel Field Effect Transistor) technology and the novel ideas for the optimized detector geometry, a unique direct hit electron detector is currently being produced.

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Language(s): eng - English
 Dates: 2016-09-302017-02-142017-03-132017-03-13
 Publication Status: Issued
 Pages: 8
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1088/1748-0221/12/03/C03047
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Title: 18th International Workshop on Radiation Imaging Detectors
Place of Event: Barcelona, Spain
Start-/End Date: 2016-07-03 - 2016-07-07

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Title: Journal of Instrumentation
Source Genre: Proceedings
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