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  Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions

Al-Hazmi, F. S., de Leeuw, D. M., Al-Ghamdi, A. A., & Shokr, F. S. (2017). Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions. Optik, 138, 207-213. doi:10.1016/j.ijleo.2017.03.073.

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Al-Hazmi, F. S., Author
de Leeuw, Dago M.1, Author           
Al-Ghamdi, A. A., Author
Shokr, F. S., Author
Affiliations:
1Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society, ou_1800284              

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Language(s): eng - English
 Dates: 2017
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1016/j.ijleo.2017.03.073
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Title: Optik
Source Genre: Journal
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Publ. Info: Stuttgart : Urban & Fischer
Pages: - Volume / Issue: 138 Sequence Number: - Start / End Page: 207 - 213 Identifier: ISSN: 0030-4026
CoNE: https://pure.mpg.de/cone/journals/resource/954925430331