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  KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires

Leclere, C., Cornelius, T., Ren, Z., Robach, O., Micha, J.-S., Davydok, A., et al. (2016). KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires. Journal of Synchrotron Radiation, 23, 1395-1400. doi:10.1107/S1600577516013849.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-297C-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-297D-7
Genre: Journal Article

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 Creators:
Leclere, C.1, Author
Cornelius, T.W.1, Author
Ren, Z.1, Author
Robach, O.2, Author
Micha, J.-S.2, Author
Davydok, A.1, Author
Ulrich, O.2, Author
Richter, Gunther3, Author           
Thomas, O.1, Author
Affiliations:
1Aix Marseille Universite, CNRS, Universite de Toulon, IM2NP UMR 7334, 13397 Marseille, France, ou_persistent22              
2CRG-IF BM32 Beamline at the European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France,, ou_persistent22              
3Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              

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Free keywords: ZWE Dünnschichtlabor
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Language(s): eng - English
 Dates: 2016-11
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1107/S1600577516013849
 Degree: -

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Title: Journal of Synchrotron Radiation
  Abbreviation : J. Synchrotron Radiat.
Source Genre: Journal
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Publ. Info: Copenhagen, Denmark : Published for the International Union of Crystallography by Munksgaard
Pages: - Volume / Issue: 23 Sequence Number: - Start / End Page: 1395 - 1400 Identifier: ISSN: 0909-0495
ISSN: 1600-5775
CoNE: https://pure.mpg.de/cone/journals/resource/954925562624