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  Imaging Plate noise reduction using the simultaneous recording of the reflected readout laser signal

Bele, P., Ochs, R., Angert, I., & Schröder, R. R. (1998). Imaging Plate noise reduction using the simultaneous recording of the reflected readout laser signal. In Electron microscopy: Proceedings of the 14th International Congress on Electron Microscopy (pp. 191-192). London: Taylor & Francis.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-7870-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-7930-F
Genre: Conference Paper
Alternative Title : Imaging Plate noise reduction using the simultaneous recording of the reflected readout laser signal

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ElectronMicroscopy_1998_1998_191.PDF (Any fulltext), 469KB
 
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 Creators:
Bele, Petra1, 2, Author           
Ochs, Rainer, Author
Angert, Isabel2, Author           
Schröder, Rasmus R.1, 2, Author           
Affiliations:
1Emeritus Group Biophysics, Max Planck Institute for Medical Research, Max Planck Society, ou_1497712              
2Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Max Planck Society, ou_1497700              

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 Abstract: Spatial resolution and detection noise characteristics are the most important properties of an electron detection system. For Imaging Plates (IP) the granularity of the beam sensitive layer and its surface topology affect the recorded luminescence signal. It results in a characteristic and reproducible fluctuation of the luminescence signal for each individual JP and adds non-linear noise to the detected signal. Here we present first results on resolution and noise correction of a new IP scanner based on a previous design [1] which now allows the detection of luminescence and reflected light signal simultaneously.

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Language(s): eng - English
 Dates: 1998
 Publication Status: Issued
 Pages: 2
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 666670
DOI: 22527
URI: http://www.researchgate.net/publication/27267187_Imaging_Plate_noise_reduction_using_the_simultaneous_recording_of_the_reflected_readout_laser_signal
Other: 4247
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Title: 14th International Congress on Electron Microscopy
Place of Event: Cancún
Start-/End Date: 1998-08-31 - 1998-09-04

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Title: Electron microscopy : Proceedings of the 14th International Congress on Electron Microscopy
  Alternative Title : Electron microscopy : Proceedings of the 14th International Congress on Electron Microscopy
Source Genre: Proceedings
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Publ. Info: London : Taylor & Francis
Pages: - Volume / Issue: 1 Sequence Number: - Start / End Page: 191 - 192 Identifier: ISBN: 0750305681
ISBN: 9780750305686