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  High-resolution analysis of currents at low-angle grain boundaries in YBCO thin films using magnetooptics and magnetic x-ray microscopy

Ruoß, S., Stahl, C., Bayer, J., Schütz, G., Albrecht, J., & Laviano, F. (2016). High-resolution analysis of currents at low-angle grain boundaries in YBCO thin films using magnetooptics and magnetic x-ray microscopy. IEEE Transactions on Applied Superconductivity, 26(3): 7500606. doi:10.1109/TASC.2016.2549180.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-C4FB-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-C4FC-E
Genre: Journal Article

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 Creators:
Ruoß, S.1, Author           
Stahl, C.1, Author           
Bayer, J.1, 2, Author           
Schütz, G.1, Author           
Albrecht, J.2, Author
Laviano, F.3, Author
Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648              
2Research Institute for Innovative Surfaces FINO, Aalen University, Beethovenstr. 1, 73430 Aalen, Germany, ou_persistent22              
3Department of Applied Science and Technology, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy, ou_persistent22              

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Free keywords: Abt. Schütz
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Language(s): eng - English
 Dates: 2016-04-01
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1109/TASC.2016.2549180
 Degree: -

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Title: IEEE Transactions on Applied Superconductivity
Source Genre: Journal
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Publ. Info: New York, NY : IEEE
Pages: - Volume / Issue: 26 (3) Sequence Number: 7500606 Start / End Page: - Identifier: ISSN: 1051-8223
CoNE: https://pure.mpg.de/cone/journals/resource/954925593491