Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs

Banagaaya, Nicodemus; Feng, Lihong; Schoenmaker, Wim; Meuris, Peter; Wieers, Aarnout; Gillon, Renaud; Benner, Peter

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Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs

Banagaaya, N., Feng, L., Schoenmaker, W., Meuris, P., Wieers, A., Gillon, R., et al. (2016). Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs. In Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) (pp. 313-318).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-AA13-C Version Permalink: https://hdl.handle.net/21.11116/0000-0000-84D3-C

Genre: Conference Paper

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Creators:
Banagaaya, Nicodemus¹, Author
Feng, Lihong¹, Author
Schoenmaker, Wim², Author
Meuris, Peter², Author
Wieers, Aarnout³, Author
Gillon, Renaud³, Author
Benner, Peter¹, Author

Affiliations:
1Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738141
2Magwel NV, Martelarenplein 13, B-3000 Leuven, Belgium, ou_persistent22
3ON Semiconductor Belgium, Oudenaarde, Belgium, ou_persistent22

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Dates: Date issued: 2016

Publication Status: Issued

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Identifiers: ISBN: 978-3-9815-3707-9

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Title: 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE 2016)

Place of Event: Dresden, Germany

Start-/End Date: 2016-03-14 - 2016-03-18

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Project name : nanoCOPS - Nanoelectronic COupled Problems Solutions

Grant ID : 619166

Funding program : Funding Programme 7 (FP7)

Funding organization : European Commission (EC)

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Title: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Source Genre: Proceedings

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 313 - 318 Identifier: -