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  Multilayer Fresnel zone plates for X-ray microscopy

Sanli, U. T., Keskinbora, K., Grévent, C., Szeghalmi, A., Knez, M., & Schütz, G. (2015). Multilayer Fresnel zone plates for X-ray microscopy. Microscopy and Microanalysis, 21(Suppl 3), 1987-1988. doi:10.1017/S1431927615010715.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-B8F4-E Version Permalink: https://hdl.handle.net/21.11116/0000-0001-DCA0-2
Genre: Journal Article

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 Creators:
Sanli, U. T.1, Author           
Keskinbora, K.1, Author           
Grévent, C.1, Author           
Szeghalmi, A.2, Author
Knez, M.3, Author
Schütz, G.1, Author           
Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648              
2Friedrich-Schiller-Universität Jena, Institut für Angewandte Physik, Jena, Germany, ou_persistent22              
3CIC nanoGUNE, San Sebastian and IKERBASQUE Basque Foundation for Science, Spain, ou_persistent22              

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Free keywords: Abt. Schütz
 Abstract: -

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Language(s): eng - English
 Dates: 2015-09-232015-08
 Publication Status: Issued
 Pages: 2
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1017/S1431927615010715
 Degree: -

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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York, NY : Springer-Verlag New York
Pages: - Volume / Issue: 21 (Suppl 3) Sequence Number: - Start / End Page: 1987 - 1988 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414