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  In situ bending of an Au nanowire monitored by micro Laue diffraction

Leclere, C., Cornelius, T. W., Ren, Z., Davydok, A., Micha, J.-S., Robach, O., et al. (2015). In situ bending of an Au nanowire monitored by micro Laue diffraction. Journal of Applied Crystallography, 48, 291-296. doi:10.1107/S1600576715001107.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-46BE-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-400F-1
Genre: Journal Article

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 Creators:
Leclere, Cédric1, Author
Cornelius, Thomas W.1, Author
Ren, Zhe1, Author
Davydok, Anton1, Author
Micha, Jean-Sébastien2, Author
Robach, Odile2, Author
Richter, Gunther3, Author           
Belliard, Laurent4, Author
Thomas, Olivier1, Author
Affiliations:
1Aix-Marseille Université, CNRS, Université de Toulon, IM2NP , Marseille, France, ou_persistent22              
2CEA, INAC, SP2M/NRS, Grenoble, France, ou_persistent22              
3Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
4Universite ́ Pierre et Marie Curie, CNRS, Institut des Nanosciences de Paris, Paris, France, ou_persistent22              

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Free keywords: Abt. Sitti; ZWE Dünnschichtlabor
 Abstract: -

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Language(s): eng - English
 Dates: 2015-01-19
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1107/S1600576715001107
 Degree: -

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Title: Journal of Applied Crystallography
Source Genre: Journal
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Publ. Info: Oxford, England : Blackwell Publishing on behalf of the International Union of Crystallography
Pages: - Volume / Issue: 48 Sequence Number: - Start / End Page: 291 - 296 Identifier: ISSN: 0021-8898
CoNE: https://pure.mpg.de/cone/journals/resource/954925410812