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  Measuring surface dislocation nucleation in defect-scarce nanostructures

Chen, L. Y., He, M.-r., Shin, J., Richter, G., & Gianola, D. S. (2015). Measuring surface dislocation nucleation in defect-scarce nanostructures. Nature Materials, 14, 707-713. doi:10.1038/nmat4288.

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 Creators:
Chen, Lisa Y.1, Author
He, Mo-rigen1, Author
Shin, Jungho1, Author
Richter, Gunther2, Author           
Gianola, Daniel S.1, Author
Affiliations:
1Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania, USA, ou_persistent22              
2Dept. Physical Intelligence, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_2054292              

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Free keywords: Abt. Sitti; ZWE Dünnschichtlabor
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Language(s): eng - English
 Dates: 2015-05-182015
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1038/nmat4288
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Title: Nature Materials
  Abbreviation : Nat. Mater.
Source Genre: Journal
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Publ. Info: London, UK : Nature Pub. Group
Pages: - Volume / Issue: 14 Sequence Number: - Start / End Page: 707 - 713 Identifier: DOI: 10.1038/nmat4288
CoNE: https://pure.mpg.de/cone/journals/resource/111054835734000