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  Hard x-ray photoelectron spectroscopy of chalcopyrite solar cell components

Gloskovskii, A., Jenkins, C. A., Ouardi, S., Balke, B., Fecher, G. H., Dai, X.-.-F., et al. (2012). Hard x-ray photoelectron spectroscopy of chalcopyrite solar cell components. Applied Physics Letters, 100(9): 092108, pp. 1-3. doi:10.1063/1.3687197.

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Gloskovskii, A.1, Author
Jenkins, C. A.1, Author
Ouardi, Siham1, Author
Balke, B.1, Author
Fecher, G. H.1, Author
Dai, X. -F.1, Author
Gruhn, T.1, Author
Johnson, B.1, Author
Lauermann, I.1, Author
Caballero, R.1, Author
Kaufmann, C. A.1, Author
Felser, C.2, Author           
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1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: Hard x-ray photoelectron spectroscopy is used to examine the partial density of states of Cu(In,Ga)Se-2 (CIGSe), a semiconducting component of solar cells. The investigated, thin Cu(In,Ga)(2) films were produced by multi-stage co-evaporation. Details of the measured core level and valence band spectra are compared to the calculated density of states. The semiconducting type electronic structure of Cu(In,Ga)(2) is clearly resolved in the hard x-ray photoelectron spectra. (C) 2012 American Institute of Physics. [doi: 10.1063/1.3687197]

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 Dates: 2012-02-27
 Publication Status: Issued
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 Identifiers: ISI: 000301504800030
DOI: 10.1063/1.3687197
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Title: Applied Physics Letters
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 100 (9) Sequence Number: 092108 Start / End Page: 1 - 3 Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223