Conversion electron Mossbauer spectroscopy of epitaxial Co2Cr0.6Fe0.4Al thin 
films

Ksenofontov, Vadim; Herbort, Christian; Jourdan, Martin; Felser, Claudia

doi:10.1063/1.2952760

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Conversion electron Mossbauer spectroscopy of epitaxial Co₂Cr_0.6Fe_0.4Al thin films

Ksenofontov, V., Herbort, C., Jourdan, M., & Felser, C. (2008). Conversion electron Mossbauer spectroscopy of epitaxial Co₂Cr_0.6Fe_0.4Al thin films. Applied Physics Letters, 92(26): 262501, pp. 1-3. doi:10.1063/1.2952760.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-8A5C-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-8A68-1

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Ksenofontov, Vadim¹, Author
Herbort, Christian¹, Author
Jourdan, Martin¹, Author
Felser, Claudia², Author

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1external, ou_persistent22
2External Organizations, ou_persistent22

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Abstract: Heusler half-metals are promising for spintronic applications. Epitaxial thin films of the exemplar compound Co(2)Cr(0.6)Fe(0.4)Al (CCFA) were investigated using conversion electron Mossbauer spectroscopy to clarify the factors influencing the spin polarization. CCFA films were deposited by rf magnetron sputtering on MgO substrates with and without an Fe buffer layer. Annealing improves their crystallographic order, causes the diffusion of Fe atoms from the Fe buffer layer into the CCFA, and favors the Co-Fe disorder. The listed factors are possible reasons for the increase and subsequent reduction of the tunneling magnetoresistance in CCFA thin films observable across the annealing temperature range. (C) 2008 American Institute of Physics.

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Dates: Date issued: 2008-06-30

Publication Status: Issued

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Identifiers: ISI: 000257424500042
DOI: 10.1063/1.2952760

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Title: Applied Physics Letters

Source Genre: Journal

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Publ. Info: Melville, NY : American Institute of Physics

Pages: - Volume / Issue: 92 (26) Sequence Number: 262501 Start / End Page: 1 - 3 Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223