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  Suppression of martensitic phase transition at the Ni2MnGa film surface

Pörsch, P., Kallmayer, M., Eichhorn, T., Jakob, G., Elmers, H. J., Jenkins, C. A., et al. (2008). Suppression of martensitic phase transition at the Ni2MnGa film surface. Applied Physics Letters, 93(2): 022501, pp. 1-3. doi:10.1063/1.2957647.

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Pörsch, P.1, Author
Kallmayer, M.1, Author
Eichhorn, T.1, Author
Jakob, G., Author
Elmers, H. J.1, Author
Jenkins, C. A.1, Author
Felser, C.2, Author           
Ramesh, R.1, Author
Huth, M.1, Author
Affiliations:
1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: We investigated magnetic and structural properties at the surface of epitaxial Ni(2)MnGa(110) Heusler films using x-ray absorption spectroscopy and x-ray magnetic circular dichroism both in transmission and total electron yield mode. The magnetic shape memory films were prepared by dc sputtering from a stoichiometric target onto sapphire substrates at an optimized substrate temperature of 773 K. X-ray diffraction confirms a (110) oriented growth on Al(2)O(3)(11 (2) over bar0) and an austenite to martensite transition at 270-280 K. At the surface the martensitic phase transition and the magnetization are strongly suppressed. The deviation in the surface properties is caused by a Mn deficiency near the surface. (C) 2008 American Institute of Physics.

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 Dates: 2008-07-14
 Publication Status: Issued
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 Identifiers: ISI: 000257796100063
DOI: 10.1063/1.2957647
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Title: Applied Physics Letters
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 93 (2) Sequence Number: 022501 Start / End Page: 1 - 3 Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223