Structure determination of thin CoFe films by anomalous x-ray diffraction

Gloskovskii, A.; Stryganyuk, G.; Ouardi, S.; Fecher, G. H.; Felser, C.; Hamrle, J.; Pištora, J.; Bosu, S.; Saito, K.; Sakuraba, Y.; Takanashi, K.

doi:10.1063/1.4755801

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Structure determination of thin CoFe films by anomalous x-ray diffraction

Gloskovskii, A., Stryganyuk, G., Ouardi, S., Fecher, G. H., Felser, C., Hamrle, J., et al. (2012). Structure determination of thin CoFe films by anomalous x-ray diffraction. Journal of Applied Physics, 112(7): 074903, pp. 074903-1-074903-3. doi:10.1063/1.4755801.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-202C-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-202D-D

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Urheber:
Gloskovskii, A., Autor
Stryganyuk, G., Autor
Ouardi, S.¹, Autor
Fecher, G. H.², Autor
Felser, C.³, Autor
Hamrle, J., Autor
Pištora, J., Autor
Bosu, S., Autor
Saito, K., Autor
Sakuraba, Y., Autor
Takanashi, K., Autor

Affiliations:
1Siham Ouardi, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863439
2Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863431
3Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863429