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  Probing of Optical Near-Fields by Electron Rescattering on the 1 nm Scale

Thomas, S., Krüger, M., Förster, M., Schenk, M., & Hommelhoff, P. (2013). Probing of Optical Near-Fields by Electron Rescattering on the 1 nm Scale. Nano Letters, 13(10), 4790-4794. doi:10.1021/nl402407r.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-CEAD-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-CEAE-2
Genre: Journal Article

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 Creators:
Thomas , Sebastian1, Author
Krüger, Michael1, Author           
Förster, Michael1, Author           
Schenk, Markus1, Author           
Hommelhoff, Peter1, Author           
Affiliations:
1Ultrafast Quantum Optics, Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445577              

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 Dates: 2013-09-052013-07-012013-09-132013-10
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: ISI: 000326356300033
DOI: 10.1021/nl402407r
URI: http://pubs.acs.org/doi/abs/10.1021/nl402407r
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Title: Nano Letters
Source Genre: Journal
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Publ. Info: Washington, DC : American Chemical Society
Pages: - Volume / Issue: 13 (10) Sequence Number: - Start / End Page: 4790 - 4794 Identifier: ISSN: 1530-6984
CoNE: https://pure.mpg.de/cone/journals/resource/110978984570403