Morphological Measurements of Faceted Crystals Using Image Analysis

Singh, M. R.; Chakraborty, J.; Ramkrishna, D.; Boerrigter, S.; Borchert, Christian; Sundmacher, Kai

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Morphological Measurements of Faceted Crystals Using Image Analysis

Singh, M. R., Chakraborty, J., Ramkrishna, D., Boerrigter, S., Borchert, C., & Sundmacher, K. (2010). Morphological Measurements of Faceted Crystals Using Image Analysis. Talk presented at AIChE Annual Meeting 2010. Salt Lake City, USA. 2010-11-07 - 2010-11-12.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0013-8EA1-D Version Permalink: https://hdl.handle.net/21.11116/0000-0003-C9F5-6

Genre: Talk

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Creators:
Singh, M. R.¹, Author
Chakraborty, J.¹, Author
Ramkrishna, D.¹, Author
Boerrigter, S.¹, Author
Borchert, Christian², Author
Sundmacher, Kai^{2, 3}, Author

Affiliations:
1School of Chemical EngineeringPurdue UniversityWest Lafayette, INDepartment of Industrial and Physical PharmacyPurdue UniversityWest Lafayette, IN, ou_persistent22
2Process Systems Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738151
3Otto-von-Guericke-Universität Magdeburg, External Organizations, ou_1738156

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Language(s): eng - English

Dates: Created: 2010

Publication Status: Not specified

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Identifiers: eDoc: 565031

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Title: AIChE Annual Meeting 2010

Place of Event: Salt Lake City, USA

Start-/End Date: 2010-11-07 - 2010-11-12

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