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  Wetting Phenomena on the Nanometer Scale

Rauscher, M., Dietrich, S., & Napiórkowski, M. (2013). Wetting Phenomena on the Nanometer Scale. In T. Ondarçuhu, & J.-P. Aimé (Eds.), Nanoscale Liquid Interfaces (pp. 83-153). Singapore: Pan Stanford Publishing. doi:10.1201/b14789-4.

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 Creators:
Rauscher, Markus1, 2, Author           
Dietrich, Siegfried1, 2, Author           
Napiórkowski, Marek3, Author
Affiliations:
1Dept. Theory of Inhomogeneous Condensed Matter, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497643              
2Universität Stuttgart, Institut für Theoretische Physik IV, ou_persistent22              
3Instytut Fizyki Teoretycznej, Wydział Fizyki, Uniwersytet Warszawski, 00-681 Warszawa, Ho ̇ a 69, Poland, ou_persistent22              

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Free keywords: Abt. Dietrich; Nanofluidics
 Abstract: -

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Language(s): eng - English
 Dates: 2013-05-022013-04-17
 Publication Status: Issued
 Pages: 70
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1201/b14789-4
 Degree: -

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Title: Nanoscale Liquid Interfaces
  Subtitle : Wetting, Patterning and Force Microscopy at the Molecular Scale
Source Genre: Book
 Creator(s):
Ondarçuhu, Thierry1, Editor
Aimé, Jean-Pierre2, Editor
Affiliations:
1 CEMES-CNRS, ou_persistent22            
2 CPMOH-CNRS, ou_persistent22            
Publ. Info: Singapore : Pan Stanford Publishing
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 83 - 153 Identifier: ISBN: 978-981-4316-45-3
ISBN: 978-981-4364-48-5
DOI: 10.4032/9789814364485
DOI: 10.1201/b14789