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  Investigation of single-crystalline nano-whiskers by different TEM-methods

Richter, G., Hillerich, K., Kelsch, M., Hahn, K., & Lang, D. (2009). Investigation of single-crystalline nano-whiskers by different TEM-methods. In W. Grogger, F. Hofer, & P. Pölt (Eds.), MC2009. Vol. 3: Materials Science (pp. 99-100). Graz: Verlag der Technischen Universität Graz, Austria.

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 Creators:
Richter, G.1, Author           
Hillerich, K.2, Author           
Kelsch, M.3, Author           
Hahn, K.3, Author           
Lang, D.4, Author           
Affiliations:
1Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
4Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM); Ehemalige Abt. Arzt; Abt. Mittemeijer; ZWE Dünnschichtlabor;
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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 435848
DOI: 10.3217/978-3-85125-062-6-422
 Degree: -

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Title: MC2009, Microscopy Conference
Place of Event: Graz, Austria
Start-/End Date: 2009-08-30 - 2009-09-04

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Title: MC2009. Vol. 3: Materials Science
Source Genre: Proceedings
 Creator(s):
Grogger, W., Editor
Hofer, F., Editor
Pölt, P., Editor
Affiliations:
-
Publ. Info: Graz : Verlag der Technischen Universität Graz, Austria
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 99 - 100 Identifier: -