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  Evidence for a layer-dependent Ehrlich-Schwöbel barrier in organic thin film growth

Zhang, X.., Barrena, E., Goswami, D., de Oteyza, D. G., Weis, C., & Dosch, H. (2009). Evidence for a layer-dependent Ehrlich-Schwöbel barrier in organic thin film growth. Physical Review Letters, 103: 136101. doi:10.1103/PhysRevLett.103.136101.

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Genre: Journal Article
Alternative Title : PRL

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 Creators:
Zhang, X .N.1, Author           
Barrena, E.1, Author           
Goswami, D.1, Author           
de Oteyza, D. G.1, Author           
Weis, C.1, Author           
Dosch, H.1, 2, Author           
Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
2Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Dosch/Rühle;
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Language(s): eng - English
 Dates: 2009-09-22
 Publication Status: Issued
 Pages: 4 pages
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 436524
DOI: 10.1103/PhysRevLett.103.136101
 Degree: -

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Title: Physical Review Letters
  Alternative Title : PRL
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 103 Sequence Number: 136101 Start / End Page: - Identifier: -