The importance of grain boundaries for the time-dependent mobility degradation 
in organic thin-film transistors

Weitz, R. T.; Amsharov, K.; Zschieschang, U.; Burghard, M.; Jansen, M.; Kelsch, M.; Rhamati, B.; van Aken, P. A.; Kern, K.; Klauk, H.

doi:10.1021/cm902145x

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The importance of grain boundaries for the time-dependent mobility degradation in organic thin-film transistors

Weitz, R. T., Amsharov, K., Zschieschang, U., Burghard, M., Jansen, M., Kelsch, M., et al. (2009). The importance of grain boundaries for the time-dependent mobility degradation in organic thin-film transistors. Chemistry of Materials, 21(20), 4949-4954. doi:10.1021/cm902145x.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C87-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C88-1

Genre: Journal Article

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Creators:
Weitz, R. T.¹, Author
Amsharov, K.¹, Author
Zschieschang, U.¹, Author
Burghard, M.¹, Author
Jansen, M.¹, Author
Kelsch, M.^{2, 3}, Author
Rhamati, B.¹, Author
van Aken, P. A.³, Author
Kern, K.¹, Author
Klauk, H.¹, Author

Affiliations:
1Max Planck Society, ou_persistent13
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; MPI für Festkörperforschung; MPI für Festkörperforschung; Stuttgart Center for Electron Microscopy (StEM); Jansen; Kern;

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Language(s): eng - English

Dates: Date issued: 2009-10-27

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 438378
DOI: 10.1021/cm902145x

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Title: Chemistry of Materials

Source Genre: Journal

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Pages: - Volume / Issue: 21 (20) Sequence Number: - Start / End Page: 4949 - 4954 Identifier: -