EDS study of planar faults in SrO doped SrTiO3

Sturm, S.; Recnik, A.; Scheu, C.; Ceh, M.

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EDS study of planar faults in SrO doped SrTiO₃

Sturm, S., Recnik, A., Scheu, C., & Ceh, M. (2000). EDS study of planar faults in SrO doped SrTiO₃. In J. Gemperlova, & I. Vavra (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences (pp. 221-222). Czechoslovak Society for Electron Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-384E-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-384F-5

Genre: Conference Paper

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Creators:
Sturm, S.¹, Author
Recnik, A., Author
Scheu, C.¹, Author
Ceh, M., Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657

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Free keywords: MPI für Metallforschung; Abt. Rühle;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Identifiers: eDoc: 198911

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Title: Proceedings of the 12th European Congress on Electron Microscopy

Place of Event: Brno/Czech Republic

Start-/End Date: 2000-07-09 - 2000-07-14

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Title: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences

Source Genre: Proceedings

Creator(s):
Gemperlova, J., Editor
Vavra, I., Editor

Affiliations:
-

Publ. Info: Czechoslovak Society for Electron Microscopy

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 221 - 222 Identifier: -