English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  The SESAM Project - Present State and Applications

Sigle, W., Krämer, S., Zern, A., Cai, Y., Eigenthaler, U., Hahn, K., et al. (2002). The SESAM Project - Present State and Applications. In J. Engelbrecht, T. Sevell, M. Witcomb, R. Cross, & P. Richards (Eds.), Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1 (pp. 329-330). Onderstepoort: Microscopy Society of Southern Africa.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Sigle, W.1, 2, Author           
Krämer, S.1, Author           
Zern, A.1, Author           
Cai, Y.3, Author           
Eigenthaler, U.1, 4, Author           
Hahn, K.1, 2, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
3Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654              
4Scientific Staff Assembly Dual Beam, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497668              

Content

show
hide
Free keywords: MPI für Metallforschung; Abt. Rühle; 67-ru_2002;
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 11075
 Degree: -

Event

show
hide
Title: ICEM 15. 15th International Congress on Electron Microscopy
Place of Event: Durban [South Africa]
Start-/End Date: 2002-09-01 - 2002-09-06

Legal Case

show

Project information

show

Source 1

show
hide
Title: Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1
Source Genre: Proceedings
 Creator(s):
Engelbrecht, J., Editor
Sevell, T., Editor
Witcomb, M., Editor
Cross, R., Editor
Richards, P., Editor
Affiliations:
-
Publ. Info: Onderstepoort : Microscopy Society of Southern Africa
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 329 - 330 Identifier: -