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  Convergent-beam EMCD: benefits, pitfalls and applications

Löffler, S., & Hetaba, W. (2018). Convergent-beam EMCD: benefits, pitfalls and applications. Microscopy, 67(S1), i60-i71. doi:10.1093/jmicro/dfx129.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-2610-2 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-2619-9
Genre: Journal Article

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Löffler, S.1, 2, Author
Hetaba, Walid3, Author           
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1University Service Centre for Transmission Electron Microscopy, TU Wien, Vienna, Austria, ou_persistent22              
2Department for Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada, ou_persistent22              
3Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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 Abstract: Energy-loss magnetic chiral dichroism (EMCD) is a versatile method for studying magnetic properties on the nanoscale. However, the classical EMCD technique is notorious for its low signal-to-noise ratio (SNR), which is why many experimentalists have adopted a convergent-beam approach. Here, we study the theoretical possibilities of using a convergent beam for EMCD. In particular, we study the influence of detector positioning as well as convergence and collection angles on the detectable EMCD signal. In addition, we analyse the expected SNR and give some guidelines for achieving optimal EMCD results.

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Language(s): eng - English
 Dates: 2017-11-072017-05-262017-12-162018-01-232018-03-01
 Publication Status: Issued
 Pages: 12
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1093/jmicro/dfx129
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Title: Microscopy
  Other : J. Electron Microsc.
Source Genre: Journal
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Publ. Info: Oxford : Oxford University Press.
Pages: 12 Volume / Issue: 67 (S1) Sequence Number: - Start / End Page: i60 - i71 Identifier: ISSN: 0022-0744