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  Towards a Quality Metric for Dense Light Fields

Adhikarla, V. K., Vinkler, M., Sumin, D., Mantiuk, R., Myszkowski, K., Seidel, H.-P., et al. (2017). Towards a Quality Metric for Dense Light Fields. In 30th IEEE Conference on Computer Vision and Pattern Recognition (pp. 3720-3729). Los Alamitos, CA: IEEE Computer Society. doi:10.1109/CVPR.2017.396.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-E476-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-25BD-2
Genre: Conference Paper

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 Creators:
Adhikarla, Vamsi Kiran1, Author           
Vinkler, Marek1, Author           
Sumin, Denis1, Author           
Mantiuk, Rafał2, Author           
Myszkowski, Karol1, Author           
Seidel, Hans-Peter1, Author           
Didyk, Piotr1, Author           
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              
2External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2016-12-05201720172017
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: Vamsi2017
DOI: 10.1109/CVPR.2017.396
 Degree: -

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Title: 30th IEEE Conference on Computer Vision and Pattern Recognition
Place of Event: Honolulu, HI, USA
Start-/End Date: 2017-07-21 - 2017-07-26

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Title: 30th IEEE Conference on Computer Vision and Pattern Recognition
  Abbreviation : CVPR 2017
  Subtitle : Proceedings
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Los Alamitos, CA : IEEE Computer Society
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 3720 - 3729 Identifier: ISBN: 978-1-5386-0458-8