Analysis and Optimization of Loss Functions for Multiclass, Top-k, and 
Multilabel Classification

Lapin, Maksim; Hein, Matthias; Schiele, Bernt

doi:10.1109/TPAMI.2017.2751607

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Analysis and Optimization of Loss Functions for Multiclass, Top-k, and Multilabel Classification

Lapin, M., Hein, M., & Schiele, B. (2018). Analysis and Optimization of Loss Functions for Multiclass, Top-k, and Multilabel Classification. IEEE Transactions on Pattern Analysis and Machine Intelligence, 40(7), 1533-1554. doi:10.1109/TPAMI.2017.2751607.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-2985-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-88CF-D

Genre: Journal Article

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Creators:
Lapin, Maksim¹, Author
Hein, Matthias², Author
Schiele, Bernt¹, Author

Affiliations:
1Computer Vision and Multimodal Computing, MPI for Informatics, Max Planck Society, ou_1116547
2External Organizations, ou_persistent22

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Language(s): eng - English

Dates: Created: 2016-12-12Submitted: 2016-12-12Published Online: 2017Date issued: 2018

Publication Status: Issued

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Identifiers: BibTex Citekey: LapinTPAMI2018
DOI: 10.1109/TPAMI.2017.2751607

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Title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Other : IEEE Trans. Pattern Anal. Mach. Intell.

Source Genre: Journal

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Publ. Info: Piscataway, NJ : IEEE

Pages: - Volume / Issue: 40 (7) Sequence Number: - Start / End Page: 1533 - 1554 Identifier: ISSN: 0162-8828
CoNE: https://pure.mpg.de/cone/journals/resource/954925479551