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  Multi-pass Shack-Hartmann planeness test: monitoring thermal stress

Schwider, J., & Leuchs, G. (2010). Multi-pass Shack-Hartmann planeness test: monitoring thermal stress. OPTICS EXPRESS, 18(8), 8094-8106. doi:10.1364/OE.18.008094.

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 Creators:
Schwider, J.1, Author           
Leuchs, G.2, Author           
Affiliations:
1Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364704              
2Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364698              

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Free keywords: Optics;
 Abstract: The multi-pass solution for surface measurements with the help of a Shack-Hartmann sensor (SHS) on the basis of a Fizeau cavity enables fast access to surface deviation data due to the high speed of the SHS and easy referencing of the measured data through difference measurements. The multi-pass solution described in a previous publication [J. Schwider, Opt. Express 16, 362 (2008)], provides highly sensitive measurements of small displacements caused by thermal non-equilibrium states of the test set up. Here, we want to demonstrate how a pulsed thermal load changes the surface geometry. In addition the temporal response for different plate materials is monitored through a fast wave front measurement with very high sensitivity. The thermal load close to a delta-function in time will be applied from the back-side of a plane plate by heating a small Peltier element with a heat impulse of known order of magnitude. The development of the surface deviation on the time axis can be monitored by storing a set of successive deviation pictures. (c) 2010 Optical Society of America

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Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
 Pages: 13
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000276610300059
DOI: 10.1364/OE.18.008094
 Degree: -

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Title: OPTICS EXPRESS
Source Genre: Journal
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Publ. Info: 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA : OPTICAL SOC AMER
Pages: - Volume / Issue: 18 (8) Sequence Number: - Start / End Page: 8094 - 8106 Identifier: ISSN: 1094-4087