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  Deep Reflectance Maps

Rematas, K., Ritschel, T., Fritz, M., Gavves, E., & Tuytelaars, T. (2016). Deep Reflectance Maps. In 29th IEEE Conference on Computer Vision and Pattern Recognition (pp. 4508-4516). Los Alamitos, CA: IEEE Computer Society. doi:10.1109/CVPR.2016.488.

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 Creators:
Rematas, Konstantinos1, Author           
Ritschel, Tobias1, Author           
Fritz, Mario2, Author           
Gavves, Efstratios1, Author
Tuytelaars, Tinne1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Computer Vision and Multimodal Computing, MPI for Informatics, Max Planck Society, ou_1116547              

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Free keywords: Computer Science, Computer Vision and Pattern Recognition, cs.CV
 Abstract: Undoing the image formation process and therefore decomposing appearance into its intrinsic properties is a challenging task due to the under-constraint nature of this inverse problem. While significant progress has been made on inferring shape, materials and illumination from images only, progress in an unconstrained setting is still limited. We propose a convolutional neural architecture to estimate reflectance maps of specular materials in natural lighting conditions. We achieve this in an end-to-end learning formulation that directly predicts a reflectance map from the image itself. We show how to improve estimates by facilitating additional supervision in an indirect scheme that first predicts surface orientation and afterwards predicts the reflectance map by a learning-based sparse data interpolation. In order to analyze performance on this difficult task, we propose a new challenge of Specular MAterials on SHapes with complex IllumiNation (SMASHINg) using both synthetic and real images. Furthermore, we show the application of our method to a range of image-based editing tasks on real images.

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Language(s): eng - English
 Dates: 2015-11-1320162016-12-122016
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: rematas16cvpr
DOI: 10.1109/CVPR.2016.488
 Degree: -

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Title: 29th IEEE Conference on Computer Vision and Pattern Recognition
Place of Event: Las Vegas, NV, USA
Start-/End Date: 2016-06-26 - 2016-07-01

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Title: 29th IEEE Conference on Computer Vision and Pattern Recognition
  Abbreviation : CVPR 2016
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Los Alamitos, CA : IEEE Computer Society
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 4508 - 4516 Identifier: -