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  Measuring Patent Thickets

Harhoff, D., Wagner, S., Pötzl, M., Natterer, M., & Graevenitz, G. v. (2014). Measuring Patent Thickets.

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 Creators:
Harhoff, Dietmar1, Author           
Wagner, Stefan2, Author
Pötzl, Matthias1, Author           
Natterer, Michael1, Author           
Graevenitz, Georg von2, Author
Affiliations:
1MPI for Innovation and Competition, Max Planck Society, ou_2035292              
2External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2014
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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