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  Evaluation of Output Embeddings for Fine-grained Image Classification

Akata, Z., Reed, S., Walter, D., Lee, H., & Schiele, B. (2015). Evaluation of Output Embeddings for Fine-grained Image Classification. In IEEE Conference on Computer Vision and Pattern Recognition (pp. 2927-2936). Los Alamitos, CA: IEEE Computer Society. doi:10.1109/CVPR.2015.7298911.

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 Creators:
Akata, Zeynep1, Author           
Reed, Scott2, Author
Walter, Daniel2, Author
Lee, Honglak2, Author
Schiele, Bernt1, Author           
Affiliations:
1Computer Vision and Multimodal Computing, MPI for Informatics, Max Planck Society, ou_1116547              
2External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 201520152015
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: Akata15cvpr
DOI: 10.1109/CVPR.2015.7298911
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Title: IEEE Conference on Computer Vision and Pattern Recognition
Place of Event: Boston, MA, USA
Start-/End Date: 2015-06-08 - 2015-06-10

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Title: IEEE Conference on Computer Vision and Pattern Recognition
  Abbreviation : CVPR 2015
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Los Alamitos, CA : IEEE Computer Society
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 2927 - 2936 Identifier: -