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  Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography

Herbig, M., Choi, P.-P., & Raabe, D. (2015). Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography. Ultramicroscopy, 153, 32-39. doi:10.1016/j.ultramic.2015.02.003.

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 Urheber:
Herbig, Michael1, Autor           
Choi, Pyuck-Pa1, Autor           
Raabe, Dierk2, Autor           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Schlagwörter: Correlative microscopy; APT; TEM; Nanobeam diffraction; Orientation mapping; ASTAR; HRTEM
 Zusammenfassung: In many cases, the three-dimensional reconstructions from atom probe tomography (APT) are not sufficiently accurate to resolve crystallographic features such as lattice planes, shear bands, stacking faults, dislocations or grain boundaries. Hence, correlative crystallographic characterization is required in addition to APT at the exact same location of the specimen. Also, for the site-specific preparation of APT tips containing regions of interest (e.g. grain boundaries) correlative electron microscopy is often inevitable. Here we present a versatile experimental setup that enables performing correlative focused ion beam milling, transmission electron microscopy (TEM), and APT under optimized characterization conditions. The setup was designed for high throughput, robustness and practicability. We demonstrate that atom probe tips can be characterized by TEM in the same way as a standard TEM sample. In particular, the use of scanning nanobeam diffraction provides valuable complementary crystallographic information when being performed on atom probe tips. This technique enables the measurement of orientation and phase maps as known from electron backscattering diffraction with a spatial resolution down to one nanometer.

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Sprache(n): eng - English
 Datum: 2014-06-212015-02-052015-02-122015-02-142015-06
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: DOI: 10.1016/j.ultramic.2015.02.003
 Art des Abschluß: -

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Titel: Ultramicroscopy
  Kurztitel : Ultramicroscopy
Genre der Quelle: Zeitschrift
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Affiliations:
Ort, Verlag, Ausgabe: Amsterdam : North-Holland
Seiten: - Band / Heft: 153 Artikelnummer: - Start- / Endseite: 32 - 39 Identifikator: ISSN: 0304-3991
CoNE: https://pure.mpg.de/cone/journals/resource/954925512451