Scanning photothermal beam deflection imaging with and without contrast 
inversion on polymers for integrated optical application

Einsiedel, H.; Mittler-Neher, Silvia

doi:10.1016/S0040-6090(96)08842-6

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Scanning photothermal beam deflection imaging with and without contrast inversion on polymers for integrated optical application

Einsiedel, H., & Mittler-Neher, S. (1996). Scanning photothermal beam deflection imaging with and without contrast inversion on polymers for integrated optical application. Thin Solid Films, 288(1-2), 243-247. doi:10.1016/S0040-6090(96)08842-6.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-BC5C-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-BC5D-F

Genre: Journal Article

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Creators:
Einsiedel, H.¹, Author
Mittler-Neher, Silvia¹, Author

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1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 1996

Publication Status: Issued

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Identifiers: DOI: 10.1016/S0040-6090(96)08842-6

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Title: Thin Solid Films

Abbreviation : Thin Solid Films

Source Genre: Journal

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Publ. Info: Lausanne, Switzerland, etc. : Elsevier

Pages: - Volume / Issue: 288 (1-2) Sequence Number: - Start / End Page: 243 - 247 Identifier: ISSN: 0040-6090
CoNE: https://pure.mpg.de/cone/journals/resource/954925449792